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Tuning vacancy trapping by impurities in Si and Ge through high-throughput selection

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M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier

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EMRS Spring Meeting 2016

Lille, France

Monday, 2 May, 2016 to Friday, 6 May, 2016

Abstract

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emrsabstract2.txt

Conference reference

EMRS Spring Meeting 2016

Postscript First

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Preface First

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