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High-Throughput Screening of Extrinsic Point Defect Properties in Si and Ge: Database and Applications

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M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier

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Poster

Conference / event / venue

International Workshop on Machine Learning for Materials Science

Espoo, Finland

Wednesday, 8 March, 2017 to Thursday, 9 March, 2017

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International Workshop on Machine Learning for Materials Science

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