Espoo, Finland
Wednesday, 8 March, 2017 to Thursday, 9 March, 2017
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| High-Throughput Screening of Extrinsic Point Defect Properties in Si and Ge: Database and Applications , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier , International Workshop on Machine Learning for Materials Science , Espoo, Finland , Wed, 08/03/2017 to Thu, 09/03/2017 |
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